particle counters, process integration, Spc, Sops, thickness measurement, Root Cause Analysis, chemical reactions, thin film processes, cvd, film and fab metrology tools, ellipsometry, Technology Transfer, XRR, NAND cell structures, Doe, ald, TEM, Sem, basic device physics, vacuum systems, plasma processes

knowledge management systems , sop development , Metrology tools, Root Cause Analysis, Process Optimization, Particle counters, Electrical evaluation methods, Thin film deposition techniques, Yield improvement, Defect analysis, ellipsometry, process integration, Compliance with safety and quality standards, Thickness measurement instruments, CD-SEM