boundary scan , RTL, MBIST, structural test vectors, test coverage analysis, low-power DFT architecture, GLS gate level simulation, ATPG, Scan Insertion, DFT implementation

Git, Perforce, C, Confluence, Jira, Python, Verilog simulation, SM3 Cobra, Native Mode Advantest V93K, MBIST, APG Algorithmic Pattern Generator

Data Analytics, Perforce, C, Python, Jira, Confluence, Git, MBIST, Verilog simulation, APG Algorithmic Pattern Generator, SM3 Cobra, Advantest V93K

Automation Scripting, Power Bi, Sql, Jtag, Excel, Python, DFT features, yield analysis, AI-assisted solutions, MBIST, CREST, Jmp, data-driven decision making, Silicon Characterization, Scan, Statistical Modeling, semiconductor test methodologies

Linux, Perl, Verilog, Tcl, Sta, Path-Delay fault models, Post-silicon debug, FPGA synthesis, Scan MBIST, Bench equipment, iJTAG, Synthesis, Dft, ATPG, Stuck-At

Scripting, Manufacturing Test Coverage, Verilog simulations, HBM, Data Analysis tools, Statistics, DRAM, CAD Tools