Automation Scripting, Power Bi, Sql, Jtag, Excel, Python, DFT features, yield analysis, AI-assisted solutions, MBIST, CREST, Jmp, data-driven decision making, Silicon Characterization, Scan, Statistical Modeling, semiconductor test methodologies

statistical data analysis , data mining, production test, IC development, wafer processing, quality and reliability, Digital principles, DfA methods, IC production technology, Fabless Standard Logic CMOS Process Technologies, assembly, yield logistics