particle counters, process integration, Spc, Sops, thickness measurement, Root Cause Analysis, chemical reactions, thin film processes, cvd, film and fab metrology tools, ellipsometry, Technology Transfer, XRR, NAND cell structures, Doe, ald, TEM, Sem, basic device physics, vacuum systems, plasma processes

advanced failure analysis, TEM, Xps, sims, ald, electrical stress testing, apt, EELS, cvd, reliability modeling, thin film technologies