Promotion of Innovation, Basic device physics, Data Analysis, Statistics, DRAM architecture, Reliability Test Flow Development, Cross-Functional Collaboration, DPM reduction, Risk Management, Project Management, Reliability Test Plan and Execution, Root Cause and Resolution of Qual and RMA Device Issues, CMOS technology, Process Conversions and HVM, Mentorship and Development of Others, Technical Decision Making

verigy 93k , data analysis tools, UFLEX, statistical methods

Power Bi, Python, Solidworks, Tableau, process integration, Data Analysis, Optimization

power integrity , Electrical Electronic System, Oscilloscope, Industry standards IPC IEC UL, Electrical safety standards, Reading and interpreting schematics, Hi-pot tester, Signal Integrity, LCR meter, Multimeter, Structured problem-solving techniques, Embedded Systems, Root Cause Analysis, Firmware debugging, Analog and digital circuitry analysis

statistical data analysis , lithography tooling, project management, photolithography process, Fmea, Spc, Doe, cost yield improvement, Camline, process transfer, Jmp