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Your Responsibilities Will Include:
· Partitioning for ATPG and hierarchical approaches
· ATPG compression and serialization
· RTL-Scan insertion and design rule fixing
· Expertise in Memory BIST including Memory Repair, In-System Test (IST) for Memories from Implementation to Verification and Silicon Debug
· Experience on Boundary Scan and writing DFT mode constraints for IP's and providing the timing feedback to STA team for DFT modes
· Experience on DFT RTL generation and Integration with RTL level QC checks like Spyglass LINT, Spyglass DFT and Fishtail
· Familiar with IEEE1149.1, IEEE1500 and IEEE1687 standards
· Performing ATPG (SAF, TDF) and MBIST verification using unit delay and min/max timing corner simulations
· Conducting in-depth knowledge and hands-on experience in ATPG coverage analysis
· Working with Product/Test engineering teams on the delivery of manufacturing test patterns for ATE
· Being responsible for diagnostic tool generation for ATPG, MBIST, and bring-up on ATE
· Having experience with state-of-the-art, industry-standard DFT tools
· Being hands-on from the nitty-gritty details to high-level planning
Minimum Qualifications:
· BE / ME (or similar) in Electronic Engineering, Computer Science, Computer Engineering, or a related field
· 7+ years of experience with DFT technologies, including scan test and MBIST
· Experience with a hardware description language such as Verilog, System Verilog, or VHDL
· Experience with one or more scripting or programming languages (e.g., Perl, Python, TCL, C, etc.)
· Ability to work well in a diverse team environment
· Experience delivering detailed technical documentation
Job ID: 150961691
Skills:
Perl, Python, Design Verification, Verification methodologies, SV, DFT Engineering, Post Silicon Testing, Uvm, Automation flow development
Skills:
Verilog, Jtag, Dft, MBIST, IEEE1500, IEEE1687, ATPG, Cadence
Skills:
DFT architecture, ATPG setup, digital design fundamentals, hierarchical DFT methodologies, silicon bring-up, JTAG simulation, SCAN solutions, DFT scripting automation, post-silicon debug
Skills:
Tcl, Verilog, Python, Jasper, Perl, Scan Insertion, VHDL, Memory Test methodologies, ATPG, Xcelium, Genus, Modus
Skills:
Tcl Scripting, Jtag, Perl, Sta, MBIST, Scan insertion techniques, Test structures for DFT IP Integration, Test mode timing constraints, ATPG, Fault Models, Post-Si ramp up and debug on ATE, Coverage improvement techniques, SDF based simulations, Insertion verification on RTL Netlist level, Scan, Memory BIST generation, Physical Design, Test point insertion, Gate level simulations
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